back scattered electron

См. также в других словарях:

• Electron retrodiffuse — Électron rétrodiffusé Les électrons rétrodiffusés (back scattered electrons en anglais) sont des électrons résultant de l impact d un faisceau d électrons dit primaire et d un échantillon. Les électrons primaires sont entrés en collision avec des …   Wikipédia en Français

• Électron rétrodiffusé — Les électrons rétrodiffusés (back scattered electrons en anglais) sont des électrons résultant de l impact d un faisceau d électrons dit primaire et d un échantillon. Les électrons primaires sont entrés en collision avec des noyaux d’atomes de… …   Wikipédia en Français

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

• Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… …   Wikipedia

• Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

• Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

• Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

• Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …   Wikipedia

• High-resolution transmission electron microscopy — (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows the imaging of the crystallographic structure of a sample at an atomic scale. [cite book |title=Experimental high resolution electron microscopy |last=Spence… …   Wikipedia

• Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… …   Wikipedia

• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia